Manufacturing and Analytical Characterization - Chemical
Category: Late Breaking Poster Abstract
Deliana Arias, M.S. (she/her/hers)
Scientist
Merck & Co., Inc.
Rahway, New Jersey, United States
Deliana Arias, M.S. (she/her/hers)
Scientist
Merck & Co., Inc.
Rahway, New Jersey, United States
Zack Zhiqiang Guo, Ph.D.
Merck & Co., Inc.
Rahway, New Jersey, United States
Nathan Contrella, Ph.D.
Merck & Co., Inc.
Rahway, New Jersey, United States
Pankaj Aggarwal, Ph.D.
Merck & Co., Inc.
Rahway, New Jersey, United States
Zheng Zhao, Ph.D.
Merck & Co., Inc.
Rahway, New Jersey, United States
Figure 1. (A) Representative noise baseline with unknown peaks in Fit-For-Purpose Method
Table 1. Summary of Columns Evaluated
Table 2. Optimized Column Conditions